Construction of a Surface Defect Classifier for Surface Barrier Layer Chip Based on Adaptive Neuro Fuzzy Inference System

碩士 === 朝陽科技大學 === 工業工程與管理系碩士班 === 92 === Since recently developed electronic products are extremely thin and light, the Surface Barrier Layer (SBL) chips are key elements of traditional disk capacitors which are widely used in many small electronic components. Because surface defects exist on the SB...

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Bibliographic Details
Main Authors: Yu-Ming Chen, 陳育洺
Other Authors: Hong Dar Lin
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/n6upmn