Defect Classification and Process Control Methods Based on Bootstrap Sampling Technique with Limited Defect Samples Applied to Computer Vision System

碩士 === 朝陽科技大學 === 工業工程與管理系碩士班 === 92 === Following the science and technology changes in the passing days, automatic production equipment and manufacturing techniques are significantly promoted to reduce the defect rates substantially. This makes the automatic detection system face serious problems...

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Bibliographic Details
Main Authors: Jing-tyng Pan, 潘勁廷
Other Authors: Hond-Dar Lin
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/88ky2p