Improveing TFT-LCD production yield with Defect pattern Recognition & Cluster Mapping
碩士 === 華梵大學 === 工業管理學系碩士班 === 92 === Under consideration of reducing operating cost, some TFT-LCD panel manufacturers substitute traditional break first-join later method with newer join first-break later method in their cell process. The problem with the latter approach is the unavoidabl...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/32775726688472115766 |