RF Measurement and Analysis of SOI-LDMOSFETs
碩士 === 華梵大學 === 機電工程研究所 === 92 === Abstract The packaged SOI-LDMOSFET device’s high frequency characteristics were measured and studied in this thesis, which fabricated by EPISIL TECHNOLOGIES INC. S-parameters were taken from HP8753C network analyzer and the device was biased u...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/33106602939985583747 |