Using Burr distribution Distribution to Estimate Capability Indices for Non-normal Process
碩士 === 國立勤益技術學院 === 工業工程與管理系 === 92 === Process yield is usually adopted to evaluate the of process capability, and Boyles(1994) proposed the yield-based process capability S''''pu, S''''pl and S''''pk for normal distribution. However these...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/18041194467893651648 |