Electromigration of Sn-Zn solders in contact with Cu

碩士 === 國立成功大學 === 材料科學及工程學系碩博士班 === 92 ===   The electro-migration behavior of Cu/Sn-Zn series solder/Cu under a current density of 650A/cm2 was investigated in this work. Meanwhile, the role of thermo-migration was investigated by the thermo-aging experiment. The Sn-Zn series solders investigated i...

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Bibliographic Details
Main Authors: Yen-Hsiang Fang, 方彥翔
Other Authors: Kwang-Lung Lin
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/20790456183159644761