Study of Growing High-Quality Metamorphic Buffer Layer by MOCVD and Selective Etching Process Technology for High Performance HEMT Applications

博士 === 國立成功大學 === 微電子工程研究所碩博士班 === 92 ===   A novel technique of directly growing high-quality InxGa1-xAs or InP buffer layers on GaAs substrates by MOCVD and a newly developed citric buffer etchant (for gate-recess process) have been proposed, which benefits the improvement of HEMT performance. Rec...

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Bibliographic Details
Main Authors: Chin-I Liao, 廖晉毅
Other Authors: Mau-Phon Houng
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/05143389943907724512