Measurement and Analysis of Adhesion Force on IC Encapsulation Mold
博士 === 國立成功大學 === 機械工程學系碩博士班 === 92 === In IC packaging, when epoxy molding compound (EMC) is filling the mold cavity and cured in the mold, adhesion occurs in the interface between EMC and mold surface. Too large an adhesion force can damage an IC and lower the yield rate. Many parameters will...
Main Authors: | Shyang-Jye Chang, 張祥傑 |
---|---|
Other Authors: | Sheng-Jye Hwang |
Format: | Others |
Language: | zh-TW |
Published: |
2004
|
Online Access: | http://ndltd.ncl.edu.tw/handle/75309601651376508763 |
Similar Items
-
Characterization on the Adhesion Force in Continuous Molding of IC Encapsulation
by: Cheng-Hung Song, et al.
Published: (2009) -
EMC Adhesion Effects on Oxidation of IC Encapsulation Mold Surface
by: Chen-HungDeng, et al.
Published: (2012) -
On Mold Corner Effects of EMC Adhesion for IC Encapsulation Process
by: Chia-HsunYeh, et al.
Published: (2011) -
Development of Test Methodology and Research on Mold Adhesion in IC Packaging
by: Jiunn-Shyang Wang, et al.
Published: (2000) -
Mold-Flow Analysis of High-Density IC Encapsulation
by: Chien-Huei Chang, et al.
Published: (2002)