A Novel Highly Reliable Flash Memory --- Characteristics, Reliability Evaluations, and Applications
博士 === 國立交通大學 === 電子工程系 === 92 === In this dissertation, a novel highly reliable Flash memory is introduced in state-of-the-art 0.15-micrometer technologies, and 3-poly process is used to fabricate the sidewall-gate novel Flash memories. At first time, a 3-poly Flash memories are utilized in both NO...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/75029931942176964799 |