TWO-PHASED META-HEURISTIC METHODS FOR THE POST-MAPPING YIELD CONTROL PROBLEM
碩士 === 國立交通大學 === 工業工程與管理系所 === 92 === Yield control plays an important role in the TFT-LCD manufacturing firms, and the post-mapping operation is a crucial step. The post-mapping operation combines one TFT plate and one CF plate to form a LCD. Each TFT and CF plate is divided into a number of panel...
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| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/p94hsj |