Localized Charge Distribution and Read Current Noise in Nitride Storage Flash Cells
碩士 === 國立交通大學 === 電子工程系所 === 92 === This thesis will focus on the discussion of localized trapped charge distribution in nitride film and read current instability issue in a SONOS type flash memory cell, which include program charge lateral spread, program disturb effect, and read current noise. In...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/29m22c |