Fabrication and Characterization of Polysilicon Thin Film Transistors with Multiple Nano-wire Channels
碩士 === 國立交通大學 === 電子工程系所 === 92 === We have studied the gate controllability of lightly-doped drain (LDD) polycrystalline silicon thin-film transistors (poly-Si TFTs) with multiple channels and different widths. We deserve that devices with an LDD structure exhibit low leakage current. Additionally,...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/seydkc |