The Electrical Characteristics and Reliability of Ultrathin Oxynitride Grown by ICP Plasma

碩士 === 國立交通大學 === 電子工程系所 === 93 ===

Bibliographic Details
Main Authors: Bo-Ning Chen, 陳柏寧
Other Authors: Kow-Ming Chang
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/37131069656754573365
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spelling ndltd-TW-092NCTU54280032016-06-03T04:14:18Z http://ndltd.ncl.edu.tw/handle/37131069656754573365 The Electrical Characteristics and Reliability of Ultrathin Oxynitride Grown by ICP Plasma 以感應耦合式電漿系統成長之超薄氮氧化矽薄膜的電特性與可靠度研究 Bo-Ning Chen 陳柏寧 碩士 國立交通大學 電子工程系所 93 Kow-Ming Chang Cheng-May Kwei 張國明 桂正楣 2004 學位論文 ; thesis 74 en_US
collection NDLTD
language en_US
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 電子工程系所 === 93 ===
author2 Kow-Ming Chang
author_facet Kow-Ming Chang
Bo-Ning Chen
陳柏寧
author Bo-Ning Chen
陳柏寧
spellingShingle Bo-Ning Chen
陳柏寧
The Electrical Characteristics and Reliability of Ultrathin Oxynitride Grown by ICP Plasma
author_sort Bo-Ning Chen
title The Electrical Characteristics and Reliability of Ultrathin Oxynitride Grown by ICP Plasma
title_short The Electrical Characteristics and Reliability of Ultrathin Oxynitride Grown by ICP Plasma
title_full The Electrical Characteristics and Reliability of Ultrathin Oxynitride Grown by ICP Plasma
title_fullStr The Electrical Characteristics and Reliability of Ultrathin Oxynitride Grown by ICP Plasma
title_full_unstemmed The Electrical Characteristics and Reliability of Ultrathin Oxynitride Grown by ICP Plasma
title_sort electrical characteristics and reliability of ultrathin oxynitride grown by icp plasma
publishDate 2004
url http://ndltd.ncl.edu.tw/handle/37131069656754573365
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