Optical characterization of layer semiconductors by thermoreflectance modulation technique
碩士 === 國立東華大學 === 材料科學與工程學系 === 92 === Modulation spectroscopy is a powerful characterization tool of semiconductors. In this article, we present a practical design for implementing the thermoreflectance (TR) measurements more effective. Detailed design diagrams of the electronic circuits containing...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/25495826137751623857 |