Optical characterization of III-VI GaSe1-xSx series layered semiconductors

碩士 === 國立東華大學 === 材料科學與工程學系 === 92 === In this study, crystals of GaSe1-xSx layer compounds with x = 0, 0.1, 0.2, 0.3, 0.4, 0.5 and 1 were grown by vertical Bridgman method. The crystallinity was investigated by X-Ray and SEM measurements . Optical property for GaSe1-xSx series layered semicondu...

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Bibliographic Details
Main Authors: Chao-Hung Cheng, 鄭照煌
Other Authors: Ching-Hua Ho
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/84954125011416706760