Structure Evolution and Related Mechanical and Electrical Properties of ZrTaTiNbSi Glass Metal Film

碩士 === 國立清華大學 === 材料科學工程學系 === 92 === In this work, Zr17Ta16Ti19Nb22Si26 amorphous thin films have been prepared from high entropy alloy target of the same composition. The derived films were subsequently annealed at various temperatures from 473 K to 1173 K for 10 minutes. X-ray diffraction resul...

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Bibliographic Details
Main Authors: Tsung-Han Yang, 楊宗翰
Other Authors: Jiong-yao Gan
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/quqdhq