Flash Memory Fault Modeling and Test Algorithm Development

碩士 === 國立清華大學 === 電機工程學系 === 92 === Flash memories are a type of non-volatile memory based on floating-gate transistors. The use of commodity and embedded Flash memories are growing rapidly as we enter the system-on-chip (SoC) era. Conventional fault models and tests for Flash memories are usually a...

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Bibliographic Details
Main Authors: Jen-Chieh Yeh, 葉人傑
Other Authors: Cheng-Wen Wu
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/61966838700739774893