IC HTOL Stress Condition Optimization
碩士 === 國立臺灣大學 === 電子工程學研究所 === 92 === HTOL (High Temperature Operation Life) test is used to determine the effects of bias and temperature stress conditions on solid-state devices over time. It simulates the devices’ operating condition in an accelerated manner, and is primarily for device reliabili...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54997796537677659963 |