Capping Effect of Cu Overlayer on Co/FeMn/Cu(001) Exchange Bias System
碩士 === 國立臺灣大學 === 物理研究所 === 92 === Overlayer capping is used as a method to investigate the influence of conduction electrons in FM on the exchange bias system because it should modify the boundary condition of itinerary electrons and this modification should propagate to the FM/AF interface where e...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2004
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/47838983765987112747 |