Microprocessor Testability Analysis for Software-Based Self-Testing
碩士 === 國立臺灣大學 === 電子工程學研究所 === 92 === Software-Based Self-Testing is a very cost efficient test method. There is no DFT overhead and it achieves at-speed testing without expensive ATE test equipment. However, there are still many bottlenecks. For example, how to generate a high fault coverage test p...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/s5g8wy |