Using Molecular Mechanics Simulation on Nano-Scale Atomic Force Microscopy Measurement and Probe Sensitivity Analysis
碩士 === 國立臺灣科技大學 === 機械工程系 === 92 === This article constructs a simulated measurement model of constant force mode in AFM contact mode, so as to simulate and analyze the outline scanning measurement of AFM. The simulation method is to calculate the force of the sample atoms towards the tip atoms of...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/57972372332957937350 |