Wafer Sort Map Automatic Sorting System and Yield Model Validation
碩士 === 國立臺北科技大學 === 工業工程與管理研究所 === 92 === The first goal of this research is to apply the image processing techniques on wafer sort maps for classifying different type of defect. Original data gathered from wafer sort maps are transferred by the image processing software. By using a few representati...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/12861864865335260191 |