Design and Measurement of Concave Grating Spectrometer Chip Based on X-ray Lithography Technique

碩士 === 元智大學 === 電機工程學系 === 92 === The design and measurement of a concave grating spectrometer chip have been studied in this thesis. By using the theory of diffraction grating, we designed the concave grating which has been fabricated on a silicon wafer by x-ray lithography technique....

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Bibliographic Details
Main Authors: Mao-Chang Liang, 梁茂璋
Other Authors: Ming-Wen Chang.
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/98744425762519073743