The Reliability Study of Low Temperature Polycrystalline Silicon Thin Film Transistors
碩士 === 國立中興大學 === 電機工程學系 === 93 === In the first part, the constant voltage stress of the low temperature polycrystalline silicon thin film transistors (LTPS TFTs) was studied, and we analyzed the variation between the characteristics of the TFTs and stress time. We find the device’s performances of...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/55393635256004054157 |