A Wafer-Level Electrical Probing Technique for GaN LEDs
碩士 === 國立成功大學 === 光電科學與工程研究所 === 93 === In this dissertation, we have designed a set of methods to predict the relative parameters of GaN LED epi-wafer before the process. Accordingly, we can avoid processing the epi-wafers that we have predicted that they will have poor device quality . By means o...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/29906100156073493476 |