Automatic dot and line defects inspection system for TFT-LCD display panels
碩士 === 國立成功大學 === 製造工程研究所碩博士班 === 93 === Nowadays, the majority TFT-LCD manufactories still depend on human eyes to inspect the defects in final test. The inspection standard may be changed by different inspectors or their mental conditions. Hence, it becomes a big problem because the future size...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/13008319396538962745 |