Correlation and Transformation of Scattering Parameters from Different Measurement Systems

碩士 === 國立成功大學 === 電腦與通信工程研究所 === 93 ===  A device tested under different microwave measurement systems usually gives different and arguable results. It would be a great help if the cause of this inconsistency could be found and a transformation between the results could be established. A primary res...

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Bibliographic Details
Main Authors: Bo-Xiang Fang, 方柏翔
Other Authors: Chih-Ming Tsai
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/15275399267207855896