Correlation and Transformation of Scattering Parameters from Different Measurement Systems

• Main Authors: Bo-Xiang Fang, 方柏翔
• Other Authors: Chih-Ming Tsai
• Format: Others
• Language: zh-TW
• Published: 2005
• Online Access: http://ndltd.ncl.edu.tw/handle/15275399267207855896

碩士 === 國立成功大學 === 電腦與通信工程研究所 === 93 === 　A device tested under different microwave measurement systems usually gives different and arguable results. It would be a great help if the cause of this inconsistency could be found and a transformation between the results could be established. A primary research on this had been reported recently. However, it is found that the method loses its accuracy when applied to measurements from network analyzers with inevitable residual errors. 　The purpose of this research is to improve and extend this method. Firstly, the effects of residual errors on the transformation, betweens results from a two-port network analyzer with different test fixtures, are thoroughly studied. A more accurate transformation has been derived. Since the demand of measurements of multi-port devices is increasing, the method has also been extended to multi-port measurements. Usually, a network analyzer has only two available ports. Therefore, multi-port measurements and transformation are different and more difficult. A solution has been proposed particularly for this situation. 　The above results apply to the measurements from one network analyzer with different test fixtures. In real world, the measurement systems in a company, or among companies, are usually based on different network analyzers with different test fixtures. At the end of this thesis, a transformation between the results from these different systems has been proposed. This not only reduces the differences between measurements, but also reduces the requirement of using high-accurate calibration kits and instruments. Therefore, this method should be very useful to the industry.