Correlation and Transformation of Scattering Parameters from Different Measurement Systems
碩士 === 國立成功大學 === 電腦與通信工程研究所 === 93 === A device tested under different microwave measurement systems usually gives different and arguable results. It would be a great help if the cause of this inconsistency could be found and a transformation between the results could be established. A primary res...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/15275399267207855896 |