An Empirical Study of Theory of Constraint（TOC）Implementation on Wafer Yield Management
碩士 === 國立交通大學 === 管理學院碩士在職專班工業工程與管理組 === 93 === For the wafer fabrication, the yield of wafer represents the quality of production processes is a very important and influence on the profit. In other words, the wafer fabrication’s qualities of product and customer’s satisfaction are increased with th...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/72718305263721771800 |