Fault Diagnosis for Delta-Sigma Modulator

碩士 === 國立交通大學 === 電子工程系所 === 93 === In this thesis, we proposed a new test method to diagnose faults in the delta-sigma modulator by measuring output voltage of integrator without input test pattern. The theoretical and simulation results show that this method has a very high accuracy to determine o...

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Bibliographic Details
Main Authors: Wei-Xian Chen, 陳威憲
Other Authors: Chung-Len Lee
Format: Others
Language:en_US
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/22111101988478428648
Description
Summary:碩士 === 國立交通大學 === 電子工程系所 === 93 === In this thesis, we proposed a new test method to diagnose faults in the delta-sigma modulator by measuring output voltage of integrator without input test pattern. The theoretical and simulation results show that this method has a very high accuracy to determine operation amplifier offsets and capacitor ratios even when the circuit has multiple faults. Finally, we present an application of the delta-sigma modulator circuit as a code edge measurement circuit for DAC. It uses delta-sigma modulation property to accurately measure a DC voltage level which could be the output of a DAC-under-test by observing the output of the PCM code. Experimental results on an implemented circuit with UMC0.18 technology show that it can give this measuring circuit a 9-bits resolution for the DAC code edge. We also supply improved method can be effectively increased the resolution by connecting an amplifier stage at the output of the DAC-under-test.