Characterization and Modeling of RF MOSFET’s Based on Four-Port Scattering-Parameter Measurement
博士 === 國立交通大學 === 電子工程系所 === 93 === With superior advancement of CMOS technologies, RF MOSFET’s have become an important candidate for the rapid growing wireless communication applications. Communication applications base on COMS technologies are potential to integrate the RF front end, base-band an...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2005
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Online Access: | http://ndltd.ncl.edu.tw/handle/75800832058464116978 |