Improvement of the optical coating process by cutting layers with sensitive monitor wavelengths
碩士 === 國立中央大學 === 光電科學研究所 === 93 === For a costly optical element production, more precise monitor method is necessary. A finer monitor method is proposed. Based on numerical analysis, the most sensitive monitor wavelength is clearly found out, and the thickness compensation for central wavelength i...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/20987835428166394405 |