A synchrotron radiation photoemission study of phase transition at the ultrathin Ni/Si(100) interface

博士 === 國立清華大學 === 材料科學工程學系 === 93 === High resolution synchrotron radiation photoemission has been used to investigate the interfacial reaction and phase formation at the ultra thin Ni/Si(100)-2x1 interface under ultrahigh vacuum. The curve-fit analysis of the Si 2p core-level spectra, based on the...

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Bibliographic Details
Main Authors: Jiing-Fa, Wen, 溫景發
Other Authors: Jenn-Chang, Hwang
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/qbhsqu