A Layout-Driven Test Methodology for Intra-Cell Defects
碩士 === 國立清華大學 === 電機工程學系 === 93 === In this thesis we investigate a defect modeling and testing methodology for intra-cell bridging defects from the layout perspective. For defect modeling, we incorporate a butterfly-based faulty schematic extraction and SPICE simulation to resolve the potential ana...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/06766180808140922697 |