The study of aberration-free image recovery for transmission electron microscopy
碩士 === 國立清華大學 === 工程與系統科學系 === 93 === Transmission electron microscopy (TEM) is a modern instrument for analyzing materials, including the imaging, structure and element analysis. However, as the diffraction patterns and images are recorded, the phase of the electronic waves is lost that the half in...
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| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/71165391106555555338 |