Optical Properties of III-Nitride Semiconductors

碩士 === 國立臺灣大學 === 光電工程學研究所 === 93 === This thesis concerns with the studies on the optical properties of III-Nitride semiconductors. X-ray diffraction (XRD), Photoluminescence (PL) , Raman scattering (RS), Scanning electron microscopy (SEM), Atomic force microscopy (AFM) and Fourier transform infrar...

Full description

Bibliographic Details
Main Authors: Jeng-Wei Yu, 游政衞
Other Authors: 馮哲川
Format: Others
Language:en_US
Online Access:http://ndltd.ncl.edu.tw/handle/79830406758231753486