A Scan Chain Partition and Reordering Technique for Scan Chain Stuck-At Fault Diagnosis
碩士 === 國立臺灣大學 === 電子工程學研究所 === 93 === Scan chain partition and reordering techniques are proposed to improve the diagnosis resolutions of scan chain single stuck-at faults. Scan chain partition separates a scan into two or more chains. Scan chain partition improves diagnosis resolutions by solving...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/02599789627525188748 |