A Study of Applying Test SPC to Promote Test Operation OEE and OEU

碩士 === 國立臺灣科技大學 === 工業管理系 === 93 === The purpose of this research is about implementation of the SPC concept to fine tune the semi-conductor test operation for chasing the optimum Overall Equipment Efficiency, as well as Overall Equipment Utilization (OEU), then eventually achieve the state of art...

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Bibliographic Details
Main Authors: Liang-kang Su, 蘇亮綱
Other Authors: Shey-huei Sheu
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/30418963206820864402