Measurement Application in Micro-Structure with Reformed Fringe Projection Mircoscope
碩士 === 國立臺北科技大學 === 光電工程系所 === 93 === Due to the progression in semiconductor manufactures, it is a trend that various products become tiny and fine. Measurement Orientation and measurement calibration technologies applied in tiny objects are developing. This article is discussing the application of...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/5e7b7r |