Measurement Application in Micro-Structure with Reformed Fringe Projection Mircoscope
碩士 === 國立臺北科技大學 === 光電工程系所 === 93 === Due to the progression in semiconductor manufactures, it is a trend that various products become tiny and fine. Measurement Orientation and measurement calibration technologies applied in tiny objects are developing. This article is discussing the application of...
Main Authors: | Chen-Tien Hung, 黃振添 |
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Other Authors: | 林世聰 |
Format: | Others |
Language: | zh-TW |
Published: |
2005
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Online Access: | http://ndltd.ncl.edu.tw/handle/5e7b7r |
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