The Research of Global Device Profile Measurement by Using Image Processing Technique
碩士 === 淡江大學 === 航空太空工程學系碩士班 === 93 === The new developments in industrial technology and advancement in automatic production technology, have resulted in the improvement of inspection both in method and efficiency. Besides, Automatic Optical Inspection has been a hot topic in recent years; it actual...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/20046693309879838302 |