Applications of electron beam lithography to the fabrication of near-field mask

碩士 === 大同大學 === 材料工程學系(所) === 93 === Miniaturization and performance improvements are driving the electronics industry to shrink the feature size of semiconductor devices. Because of its diffraction limit, conventional optical or ultraviolet photolithography is becoming increasingly inadequate. In o...

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Bibliographic Details
Main Authors: Chih-Husn Lin, 林志勳
Other Authors: Chi-Yuan Huang
Format: Others
Language:en_US
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/42550591817798252392