The Impact Test and Finite Element Analysis of Printed Circuit board
碩士 === 元智大學 === 機械工程學系 === 93 === It is not unusual for electronic products subjecting impact during the transportation or operation. The damage induced by the impact is one of the main causes for the failure in electronic products. Thus, impact test is required in most electronic devices. In this i...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/97556936143542921323 |