AlGaInP Light Emitting Diode Junction Temperature study

碩士 === 長庚大學 === 光電工程研究所 === 94 === There are two generally and accurately method to measure junction temperature. These two methods are called emission peak wavelength shift method and diode forward-voltage method. The defect of these methods is that the junction temperature measurements are strongl...

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Bibliographic Details
Main Authors: Y. K. Yang, 楊延鍇
Other Authors: N. C. Chen
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/20239708469798222678