A comparison of fault simulation experiments and fault tolerant capability analysis under different developing environments

碩士 === 中華大學 === 資訊工程學系碩士班 === 94 === With the progressing of Semiconductor Fabrication Techniques, more and more transistors have been accommodated in a single chip. Upon the challenges of complexity and difficulty, the System-On Chip and embedded system have gradually merged into the main stream o...

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Bibliographic Details
Main Authors: Shang-Yu Tao, 陶尚宇
Other Authors: Yung-Yuan Chen
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/06130418940308472323