Improving the Electrical Characteristics of NixTi1-xO High K Dielectric by Plasma Treatment and Pre-oxidation Treatment for MIM Capacitors
碩士 === 逢甲大學 === 產業研發碩士班 === 94 === RTA( Rapid Thermal Annealing) Technology has been applied to the process in VLSI, extensive with thermal budget, because RTA technology can insert the advantage of bringing the environment that the chip is in up to more than 1000 degrees Centigrade within short tim...
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ndltd-TW-094FCU053340042015-12-11T04:04:18Z http://ndltd.ncl.edu.tw/handle/86582060788486740155 Improving the Electrical Characteristics of NixTi1-xO High K Dielectric by Plasma Treatment and Pre-oxidation Treatment for MIM Capacitors 利用氧化前處理及電漿處理改善鎳鈦酸高介電薄膜應用在MIM電容 Kuo-Wei Hung 洪國瑋 碩士 逢甲大學 產業研發碩士班 94 RTA( Rapid Thermal Annealing) Technology has been applied to the process in VLSI, extensive with thermal budget, because RTA technology can insert the advantage of bringing the environment that the chip is in up to more than 1000 degrees Centigrade within short time, have already been adopted extensively gradually. In this work, the first oxidization of nickel/titanium film is completed by RTA. Then,the second oxidization at 450℃ using furnace. Finally, NiTiO3 film is melted by nitrogen treatment at 450 ℃. We find that it will improve property by directly oxidization after pre-oxidation and post-oxidation treatment. Wen-Luh Yang 楊文祿 2006 學位論文 ; thesis 75 zh-TW |
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碩士 === 逢甲大學 === 產業研發碩士班 === 94 === RTA( Rapid Thermal Annealing) Technology has been
applied to the process in VLSI, extensive with thermal budget, because RTA technology can insert the advantage of bringing the environment that the chip is in up to more than 1000 degrees Centigrade within short time, have already been adopted extensively gradually. In this work,
the first oxidization of nickel/titanium film is completed by RTA. Then,the second oxidization at 450℃ using furnace.
Finally, NiTiO3 film is melted by nitrogen treatment at 450 ℃. We find that it will improve property by directly oxidization after pre-oxidation and post-oxidation treatment.
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author2 |
Wen-Luh Yang |
author_facet |
Wen-Luh Yang Kuo-Wei Hung 洪國瑋 |
author |
Kuo-Wei Hung 洪國瑋 |
spellingShingle |
Kuo-Wei Hung 洪國瑋 Improving the Electrical Characteristics of NixTi1-xO High K Dielectric by Plasma Treatment and Pre-oxidation Treatment for MIM Capacitors |
author_sort |
Kuo-Wei Hung |
title |
Improving the Electrical Characteristics of NixTi1-xO High K Dielectric by Plasma Treatment and Pre-oxidation Treatment for MIM Capacitors |
title_short |
Improving the Electrical Characteristics of NixTi1-xO High K Dielectric by Plasma Treatment and Pre-oxidation Treatment for MIM Capacitors |
title_full |
Improving the Electrical Characteristics of NixTi1-xO High K Dielectric by Plasma Treatment and Pre-oxidation Treatment for MIM Capacitors |
title_fullStr |
Improving the Electrical Characteristics of NixTi1-xO High K Dielectric by Plasma Treatment and Pre-oxidation Treatment for MIM Capacitors |
title_full_unstemmed |
Improving the Electrical Characteristics of NixTi1-xO High K Dielectric by Plasma Treatment and Pre-oxidation Treatment for MIM Capacitors |
title_sort |
improving the electrical characteristics of nixti1-xo high k dielectric by plasma treatment and pre-oxidation treatment for mim capacitors |
publishDate |
2006 |
url |
http://ndltd.ncl.edu.tw/handle/86582060788486740155 |
work_keys_str_mv |
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