Design a Bilt-In Circuit Delay Self Testing Methodology
碩士 === 逢甲大學 === 產業研發碩士班 === 94 === The accurate delay measurement is a major issue to test advanced SoC chips. Today, the question was use the ATE for testing. But low/noisy supply voltage design will induces CUT delay, and makes the ATE or scan testing technique hard to capture the correct output d...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2006
|
Online Access: | http://ndltd.ncl.edu.tw/handle/19164658140160032434 |
id |
ndltd-TW-094FCU05334012 |
---|---|
record_format |
oai_dc |
spelling |
ndltd-TW-094FCU053340122015-12-11T04:04:28Z http://ndltd.ncl.edu.tw/handle/19164658140160032434 Design a Bilt-In Circuit Delay Self Testing Methodology 內嵌式電路延遲自我測試策略之設計 Chiu-Mao Yang 楊秋茂 碩士 逢甲大學 產業研發碩士班 94 The accurate delay measurement is a major issue to test advanced SoC chips. Today, the question was use the ATE for testing. But low/noisy supply voltage design will induces CUT delay, and makes the ATE or scan testing technique hard to capture the correct output delay responses. So we propose a built-in circuit delay self testing (DBIST) methodology. Use the Built-in delay testing circuit to detect the Circuit Under Test(CUT) of delay time and scan-out of the result. In the circuit of delay, We use the Veriner Delay Line(VDL) measure circuit to modify, and propose a new structure of VDL measure circuit to decrease the area and power consumption. It’s also can decrease the time of data scan out . So, we have emphasize the VDL of measure analysis, stable, area and power consumption adjust and simple the circuit of structure . When the measure analysis and stable have to improve, that it can be measure the circuit of delay time and error . Keyword:BIST(Built-In Self Testing)、VDL(Vernier Delay Line) Ching-Hwa Cheng 鄭經華 2006 學位論文 ; thesis 51 zh-TW |
collection |
NDLTD |
language |
zh-TW |
format |
Others
|
sources |
NDLTD |
description |
碩士 === 逢甲大學 === 產業研發碩士班 === 94 === The accurate delay measurement is a major issue to test advanced SoC chips. Today, the question was use the ATE for testing. But low/noisy supply voltage design will induces CUT delay, and makes the ATE or scan testing technique hard to capture the correct output delay responses. So we propose a built-in circuit delay self testing (DBIST) methodology. Use the Built-in delay testing circuit to detect the Circuit Under Test(CUT) of delay time and scan-out of the result. In the circuit of delay, We use the Veriner Delay Line(VDL) measure circuit to modify, and propose a new structure of VDL measure circuit to decrease the area and power consumption. It’s also can decrease the time of data scan out . So, we have emphasize the VDL of measure analysis, stable, area and power consumption adjust and simple the circuit of structure . When the measure analysis and stable have to improve, that it can be measure the circuit of delay time and error .
Keyword:BIST(Built-In Self Testing)、VDL(Vernier Delay Line)
|
author2 |
Ching-Hwa Cheng |
author_facet |
Ching-Hwa Cheng Chiu-Mao Yang 楊秋茂 |
author |
Chiu-Mao Yang 楊秋茂 |
spellingShingle |
Chiu-Mao Yang 楊秋茂 Design a Bilt-In Circuit Delay Self Testing Methodology |
author_sort |
Chiu-Mao Yang |
title |
Design a Bilt-In Circuit Delay Self Testing Methodology |
title_short |
Design a Bilt-In Circuit Delay Self Testing Methodology |
title_full |
Design a Bilt-In Circuit Delay Self Testing Methodology |
title_fullStr |
Design a Bilt-In Circuit Delay Self Testing Methodology |
title_full_unstemmed |
Design a Bilt-In Circuit Delay Self Testing Methodology |
title_sort |
design a bilt-in circuit delay self testing methodology |
publishDate |
2006 |
url |
http://ndltd.ncl.edu.tw/handle/19164658140160032434 |
work_keys_str_mv |
AT chiumaoyang designabiltincircuitdelayselftestingmethodology AT yángqiūmào designabiltincircuitdelayselftestingmethodology AT chiumaoyang nèiqiànshìdiànlùyánchízìwǒcèshìcèlüèzhīshèjì AT yángqiūmào nèiqiànshìdiànlùyánchízìwǒcèshìcèlüèzhīshèjì |
_version_ |
1718147527609417728 |