Analog Integrated Circuits Testing and Diagnosis：Based on Frequency and Time Domain
碩士 === 逢甲大學 === 電子工程所 === 94 === With the integration of analog and digital circuits on a single chip, the testing of mixed-signal circuits is even more difficult than digital circuits. While digital ATPG techniques have become mature and cost-effective, testing analog parts and the mixed system is...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/24644171730618179325 |