A New Testing Method for LCM
碩士 === 逢甲大學 === 電子工程所 === 94 === A new system of Failure Analysis for TFT-LCD module is presented. This system is suitable to two package types (TCP and COF) of TFT-LCD source-driver and gate-driver. This system consists of high success rate (~95%) de-capsulate technique, new sockets between device...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95014445623160654421 |